Monday, August 15, 2016

SEM Upgrade

The Condensed Matter and Materials Physics (CMMP) group at the FSU Department of Physics and the Biological Sciences Imaging Resource (BSIR) have combined their efforts to bring more advanced scanning electron microscopy (SEM) to the FSU research community.

CMMP has decommissioned its JEOL 5900 to help BSIR support and manage its FEI Nova nanoSEM 400. This system includes a FEG source, low vacuum capability, and an Oxford INCA x-sight EDS detector. A Raith ELPHY e-beam lithography (EBL) package is available for e-beam lithography.

This highlights CMMP's committed effort to work across organizational boundaries to support research at FSU.

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